Cleaning of cantilevers for atomic force microscopy in supercritical carbon dioxide Статьи журнала «Сверхкритические Флюиды: Теория и Практика»

2014, №1

сс. 86-94

P.S. Timashev, S.L. Kotova, N.N. Glagolev, N.A. Aksenova, A.B. Solovieva, V.N. Bagratashvili

Key words: atomic force microscopy, cantilevers, surface cleaning, supercritical carbon dioxide

A new method for gentle cleaning of cantilevers used in the atomic force microscopy
(AFM) in supercritical carbon dioxide (SC-CO₂) is suggested. Artificial organic
pollutant (polyethylmetacrilate) can be removed by treatment in SC-CO₂ without any
damage of the sample structure and operational characteristics. Using Raman
spectroscopy and scanning electron microscopy a complete removal of the pollutant
from the sample surface is proven. After treatment in SC-CO₂ no bands attributed to
the organic pollutant are present in Raman spectra. The images of calibration grids
obtained using the SC-CO₂ treated cantilevers are more sharp and clear compared to
those obtained using the same cantilevers in «as obtained» state without any treatment;
the number of artifact features on the images obtained using the SC-CO₂ treated
cantilevers is also lower.

Translated article

doi:10.1134/S1990793114080168

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ГОСТ
7.0.100-2018

Тимашев, П.С. Cleaning of cantilevers for atomic force microscopy in supercritical carbon dioxide / П.С. Тимашев, С.Л. Котова, Н.Н. Глаголев [и др.]. – Текст : непосредственный // Сверхкритические Флюиды: Теория и Практика.. – 2014. – Т. 9. – № 1. – С. 86-94.

TRANSLIT

Timashev, P.S. Ochistka zondov dlya atomno-silovoj mikroskopii v sverhkriticheskom diokside ugleroda / P.S. Timashev, S.L. Kotova, N.N. Glagolev [i dr.]. – Sverhkriticheskie Flyuidy: Teoriya i Praktika.. – 2014. – Т. 9. – № 1. – S. 86-94.

P.S. Timashev, S.L. Kotova, N.N. Glagolev, N.A. Aksenova, A.B. Solovieva, V.N. Bagratashvili Cleaning of cantilevers for atomic force microscopy in supercritical carbon dioxide. Sverhkriticheskie Flyuidy: Teoriya i Praktika, 1, 86-94 (2014). https://doi.org/

Cleaning of cantilevers for atomic force microscopy in supercritical carbon dioxide

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