Key words: atomic force microscopy, cantilevers, surface cleaning, supercritical carbon dioxide
A new method for gentle cleaning of cantilevers used in the atomic force microscopy (AFM) in supercritical carbon dioxide (SC-CO2) is suggested. Artificial organic pollutant (polyethylmetacrilate) can be removed by treatment in SC-CO2 without any damage of the sample structure and operational characteristics. Using Raman spectroscopy and scanning electron microscopy a complete removal of the pollutant from the sample surface is proven. After treatment in SC-CO2 no bands attributed to the organic pollutant are present in Raman spectra. The images of calibration grids obtained using the SC-CO2 treated cantilevers are more sharp and clear compared to those obtained using the same cantilevers in «as obtained» state without any treatment; the number of artifact features on the images obtained using the SC-CO2 treated cantilevers is also lower.